Publication date: 31 October 2017
Source:Thin Solid Films, Volume 640
Author(s): Jiann-Shing Jeng, Li-Lan Yang, J.S. Chen
Erbium-doped SiO2 -TiO2 thin films were prepared by the sol-gel method, using erbium nitrate pentahydrate powder, tetraethyl-orthosilicate (TEOS), and titanium tetraisopropoxide (TTIP) as precursors. The Si/Ti ratios in the SiO2 -TiO2 films agree with the TEOS/TTIP molar ratio in the sol-gel precursor. Atomic coordination structure of erbium was defined by extended X-ray absorption fine structure spectrometry (EXAFS) and optical properties of the films were characterized by micro-photoluminescence (Micro-PL). The first-neighbor-shell coordination number of erbium in SiO2 -TiO2 thin films would influence the optical properties. The 7002 -20%TiO2 :Er1.0% (mol%) film with the lowest coordination number exhibits the highest photoluminescence intensity. Moreover, Fourier transform infrared spectroscopy (FTIR) analysis reveals that the main bonding structures of SiO2 -TiO2 thin films are related to the erbium dopants. The modification of microstructure and chemical bonding configuration in the SiO2 -TiO2 films by the Er-doping concentration and its influence on the optical properties are discussed.
Source:Thin Solid Films, Volume 640
Author(s): Jiann-Shing Jeng, Li-Lan Yang, J.S. Chen