In situ X-ray diffraction studies on the piezoelectric response of PZT thin films

Publication date: 31 March 2016
Source:Thin Solid Films, Volume 603
Author(s): A. Davydok, T.W. Cornelius, C. Mocuta, E.C. Lima, E.B. Araujo, O. Thomas
Piezoelectric properties of randomly oriented self-polarized PbZr0.50Ti0.50O3 (PZT) thin films were investigated using in situ synchrotron X-ray diffraction. Possibilities for investigating the piezoelectric effect using micro-sized hard X-ray beams are demonstrated and perspectives for future dynamical measurements on PZT samples with variety of compositions and thicknesses are given. Studies performed on the crystalline [100, 110] directions evidenced piezoelectric anisotropy. The piezoelectric coefficient d33 was calculated in terms of the lab reference frame (dperp) and found to be two times larger along the [100] direction than along the [110] direction. The absolute values for the dperp amount to 120 and 230pm/V being in good agreement with experimental and theoretical values found in literature for bulk PZT ceramics.