Publication date: 1 October 2016
Source:Thin Solid Films, Volume 616
Author(s): V.K. Ashith, K. Gowrish Rao
The paper reports deposition and characterization of CdS thin films by micro-controlled SILAR technique using CdCl2 and Na2 S as precursors. The thickness of the films was found to increase with number of immersion cycles, and also with the concentration of precursor solutions. But this increase in thickness was observed only up to a certain limit beyond which films showed peeling effect. The films were found to be polycrystalline with cubic structure. The lattice constant, crystallite size and average strain on the films were found from detailed XRD analysis. Optical characterization revealed that the films exhibit quantum size effect due to their nano crystalline nature.
Source:Thin Solid Films, Volume 616
Author(s): V.K. Ashith, K. Gowrish Rao