Publication date: 1 October 2016
Source:Thin Solid Films, Volume 616
Author(s): Li Wan, Gregory Thompson
As the length scale decreases, materials can undergo size-dependent phase changes. This work explores the hcp to bcc Ti transformations in Ti/V multilayers of equal volume fraction. A series of Ti/V multilayers were sputter-deposited and revealed a transition at ~in situ growth stress measurements that are correlated to the epitaxial orientation of the Ti and V growth directions with respect to each other within the multilayer. It was found the hcp Ti undergoes in-plane compression while bcc V undergoes in-plane tension. It is believed that the interplay of large misfit strain and the surface energy driven intermixing, quantified by atom probe tomography, contributes to the stabilization of bcc Ti.
Source:Thin Solid Films, Volume 616
Author(s): Li Wan, Gregory Thompson