Adhesion behavior of diamond-like carbon films with F and Si co-doping prepared by radio frequency reactive magnetron sputtering

Publication date: 31 January 2017
Source:Thin Solid Films, Volume 622
Author(s): Wei Wu, Zhipeng Zhu, Jiawei Min, Jiandong Zhang, Non Qian, Meifu Jiang
Diamond-like carbon (DLC) films with F and Si co-doping (DLC:F:Si films) were deposited on medical 316L stainless steel substrates with radio frequency reactive magnetron sputtering by using trifluromethane (CHF3) and argon as source gases and SiC crystal target. The relations between the RF input powers and adhesion behavior of DLC:F:Si films were investigated. Surface morphology and roughness, hardness, sp²/sp³ hybridization ratio, and bonding configuration were characterized subsequently to demonstrate the adhesion evolution by Atomic force microscope (AFM), nanoindenter, Raman spectrometer, Fourier-transform infrared (FTIR) spectrometer and Friction and wear tester. The relative intensity of the CF symmetric stretch vibration (1160cm⁻¹) to CF2 asymmetric stretch vibration (1220cm⁻¹) and HFCC< stretch vibration (1620cm⁻¹) to F2CC< stretch vibration (1710cm⁻¹) as a function of RF input powers were especially demonstrated. The results show that choosing a appropriate RF input power can effectively modulate the structure and adhesion characteristics of DLC:F:Si films. The DLC:F:Si films prepared at about 200W RF input power have stable bond configuration and exhibit good adherence, hardness and wear resistance.