Publication date: 1 April 2017
Source:Thin Solid Films, Volume 627
Author(s): L. Skowronski, A.A. Wachowiak, K. Zdunek, M. Trzcinski, M.K. Naparty
This paper presents a study of optical and microstructural properties of the TiO2 /316L, TiO2 /Ti/316L and TiO2 /Ti/glass interference systems obtained by gas injection magnetron sputtering technique (GIMS) employing a commercial magnetron line. The samples are examined by means of spectrophotometry, spectroscopic ellipsometry, confocal optical microscopy, X-ray photoelectron spectroscopy and atomic force microscopy. The investigation is completed by colorimetric analysis. Our analysis shows the significant differences in the color of samples with a TiO2 layer with the thickness of this layer in the range 30–35
Source:Thin Solid Films, Volume 627
Author(s): L. Skowronski, A.A. Wachowiak, K. Zdunek, M. Trzcinski, M.K. Naparty